Scanning Electron Microscopes (SEM)

Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within numerous different research fields, spanning everything from materials science to forensics, to industrial manufacturing, and even to the life sciences.

As soon as microscopic information about the surface or near-surface region of a specimen is needed, SEM becomes a necessary tool. For that reason, the method finds applications in nearly every branch of science, technology and industry.

Floor model SEMs offer the flexibility and versatility to meet a wide range of academic and industrial needs: support for large and heavy samples, a very wide range of accessories, excellent imaging quality for the most challenging materials or the smallest details, and dynamic experimentation.